NADAtech v1X


  • 1x automated visible wafer inspection
  • completely customizable inspections using National Instruments Vision Builder application suite
  • bright field and dark field illumination and optics.
  • with +flip option any lighting field can be applied to any wafer surface
  • standard ascii and SECS/GEM reporting with defect size and location
  • all image reporting formats are available.
  • optional industry standard XY Report Formatting
  • inspections are typically adding 8secs per wafer pass for first inspect and 3 seconds for additional inspections