- 1x automated visible wafer inspection
- completely customizable inspections using National Instruments Vision Builder application suite
- bright field and dark field illumination and optics.
- with +flip option any lighting field can be applied to any wafer surface
- standard ascii and SECS/GEM reporting with defect size and location
- all image reporting formats are available.
- optional industry standard XY Report Formatting
- inspections are typically adding 8secs per wafer pass for first inspect and 3 seconds for additional inspections